September 16, 2014 –
CALIT2 and the LEXI lab (Laboratory for Electron and Xray Instrumentation) will host a 5-part lecture series next week for users and potential users of the materials characterization equipment in the Microscopy Center and Materials Characterization Center.
Beginning Monday, Sept. 22, and concluding Monday, Sept. 29, the lectures will be held from 9-10:30 a.m. in the CALIT2 Building, Room 3008. The goal of the series, says lab Operations Director Jian-Guo Zheng, is to help users better understand the capabilities and principles of the SEMs and TEM, obtain higher quality data and learn to explain their results better.
The schedule is:
Sept. 22 – SEM imaging and principles
Sept. 24 – EDS composition analysis and principles
Sept. 25 – FIB and advanced capabilities in SEM
Sept. 26 – TEM instrument principles and electron diffraction
Sept. 29 – TEM imaging: diffraction contrast and phase contrast
All lectures are free but reservations are requested at: https://docs.google.com/spreadsheet/ccc?key=ccc?key=0AlVa2cfmNf6XdE1mZVNzT0JRT0lzSlk5X1R3b2VjTmc#gid=0
